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丹麥Image Metrology A/S
丹麥Image Metrology公司掃描探針圖像處理系統(tǒng)SPIP

Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".

Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
Correction tools for creating the most accurate presentation of the "true" surface

Automated analysis techniques assuring high accuracy, quality and cost efficiency

Visualization and reporting tools enabling convincing and impressive communication of results
This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP?. SPIP? supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.

Image Metrology is a highly innovative company constantly developing new solutions meeting the demands from our high-tech customers. Image Metrology is supplying its products directly to the end users or via our distribution network, and having an export rate of 98%.